{"id":12279,"date":"2025-12-03T09:00:28","date_gmt":"2025-12-03T08:00:28","guid":{"rendered":"https:\/\/talentimpulse.cea.fr\/offre-emploi\/ingenieur-caracterisation-et-fiabilite-de-composants-photonique-sur-si-h-f\/"},"modified":"2026-03-02T09:00:12","modified_gmt":"2026-03-02T08:00:12","slug":"ingenieur-caracterisation-et-fiabilite-de-composants-photonique-sur-si-h-f","status":"publish","type":"offre-emploi","link":"https:\/\/talentimpulse.cea.fr\/en\/offre-emploi\/ingenieur-caracterisation-et-fiabilite-de-composants-photonique-sur-si-h-f\/","title":{"rendered":"CMOS Si-photonics Reliability Engineer H\/F"},"content":{"rendered":"<p>Join us, Why? Silicon photonics technologies have recently emerged worldwide to ensure high-speed, reliable and massive data transfer notably in the frame of the AI development that requires large data centers and big data analysis, as well as for Quantum computing or optical sensors. Photonics Integrated circuits (PIC) are envisaged as a CMOS compatible solution to embed on-chip data transfer between electronic calculation poles.\u00a0 Like CMOS transistors, PIC circuits are subject to scaling law, 3D integration and co-packaging. These levers also increase the need for reliable devices and components, optically and electrically. In the frame of an industrial partnership, we are looking for a reliability engineer dedicated to measure, understand and optimize the electrical and optical degradation of PIC devices such as photo-diodes and photo-modulators on 300mm Si-based wafers. What for? You will work with William and Krunoslav in the frame of an industrial partnership on the evaluation of the reliability of HSPM (High Speed Phase Modulator) and HSPD (High Speed PhotoDiode). Your daily work will include: Building Reliability setup under light (O\/C Band laser sources) and under dark conditions for both devices to characterize degradation under aging conditions. Building an electro-optical 110 GHz characterization solution to access RF performance of the devices and understand the degradation of these FOMs Determine empirical and physical based degradation models from experimental data (dark\/light conditions) Performing TCAD simulations to help understanding the aging physics of the devices Extract lifetime of devices under operating conditions Report\/present the results with industrial partners during technical meetings Ensure a proper data\/methods sustainability<\/p>","protected":false},"featured_media":0,"template":"","categories":[167],"tags":[],"class_list":["post-12279","offre-emploi","type-offre-emploi","status-publish","hentry","category-materiaux-et-procedes-emergents-pour-les-nanotechnologies-et-la-microelectronique"],"acf":[],"aioseo_notices":[],"_links":{"self":[{"href":"https:\/\/talentimpulse.cea.fr\/en\/wp-json\/wp\/v2\/offre-emploi\/12279","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/talentimpulse.cea.fr\/en\/wp-json\/wp\/v2\/offre-emploi"}],"about":[{"href":"https:\/\/talentimpulse.cea.fr\/en\/wp-json\/wp\/v2\/types\/offre-emploi"}],"wp:attachment":[{"href":"https:\/\/talentimpulse.cea.fr\/en\/wp-json\/wp\/v2\/media?parent=12279"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/talentimpulse.cea.fr\/en\/wp-json\/wp\/v2\/categories?post=12279"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/talentimpulse.cea.fr\/en\/wp-json\/wp\/v2\/tags?post=12279"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}