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Advanced nano characterization
Optomechanical force probes development for high speed AFM
The proposed topic is part of a CARNOT project aiming at developing a new generation of force sensors based on optomechanical transduction. These force sensors will be implemented in ultrafast AFM microscopes for imaging and force spectroscopy. They will allow to address biological and biomedical applications on sub-microsecond or even nanosecond time scales in force...
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Advanced nano characterization
Development and application of TERS/TEPL technique for advanced characterization of materials
TERS/TEPL (Tip-Enhanced Raman Spectroscopy and Tip-Enhanced Photoluminescence) are powerful analytical techniques developed for nanoscale material characterization. The recent acquisition of a unique and versatile TERS/TEPL equipment at PFNC (Nano-characterization Platform) of CEA LETI opens up new horizons for materials characterization. This tool combines Raman spectroscopy, photoluminescence, and scanning probe microscopy. It features multi-wavelength capabilities (from...