The development of 4D-STEM (Scanning Transmission Electron Microscopy) has profoundly transformed transmission electron microscopy (TEM) by enabling the simultaneous recording of spatial (2D) and diffraction (2D) information at each probe position. These so-called “4D” datasets make it possible to extract a wide variety of virtual contrasts (bright-field imaging, annular dark-field imaging, ptychography, strain and orientation...

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The inspection of wafer surfaces is critical in microelectronics to detect defects affecting chip quality. Traditional methods, based on physical models, are limited in accuracy and computational efficiency. This thesis proposes using artificial intelligence (AI) to characterize and model wafer topography, leveraging optical interferometry techniques and advanced AI models. The goal is to develop AI...

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This thesis falls within the field of cooled infrared detectors. The CEA-LETI-MINATEC Infrared Laboratory specializes in the design and manufacture of infrared camera prototypes used in defense, astronomy, environmental monitoring, and satellite meteorology. In this context of high-performance imaging, it is crucial to ensure optimal detector quality. However, manufacturing processes can introduce defects that can...

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