Development and application of TERS/TEPL technique for advanced characterization of materials

  • Advanced nano characterization,
  • PostDoc
  • CEA-Leti
  • Grenoble
  • Level 8
  • 2024-01-01
  • LE Van-Hoan (DRT/DPFT//LPMS)

TERS/TEPL (Tip-Enhanced Raman Spectroscopy and Tip-Enhanced Photoluminescence) are powerful analytical techniques developed for nanoscale material characterization. The recent acquisition of a unique and versatile TERS/TEPL equipment at PFNC (Nano-characterization Platform) of CEA LETI opens up new horizons for materials characterization. This tool combines Raman spectroscopy, photoluminescence, and scanning probe microscopy. It features multi-wavelength capabilities (from UV to NIR), allowing a wide range of applications and providing unparalleled insights into the composition, structure, and mechanical/electrical properties of materials at nanoscale resolution. The current project aims to develop and accelerate the implementation of the TERS/TEPL techniques at PFNC to fully exploit its potential in diverse ongoing projects at CEA-Grenoble (LETI/LITEN/IRIG) and with its partners.

doctorat en physique des matériaux, en spectroscopie ou dans un domaine connexe. Des expériences démontrées dans les techniques TERS et TEPL ainsi que dans la caractérisation avancée des matériaux sont fortement exigées.

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